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1

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels –An explanation and die protection strategy

M.S.B. Sowariraj, Theo Smedes, Cora Salm, Ton Mouthaan, Fred G Kuper

Journal:

Microelectronics Reliability

Année:

2003

Fichier:

PDF, 1.26 MB

2003

2

A 3-D Circuit Model to evaluate CDM performance of ICs

M.S.B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton Mouthaan, Fred G Kuper

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 695 KB

english, 2005

3

Low-frequency noise in hot-carrier degraded nMOSFETs

Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 456 KB

english, 2007

4

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress

M.S.B. Sowariraj, Cora Salm, Ton Mouthaan, Fred G Kuper, Theo Smedes

Journal:

Microelectronics Reliability

Année:

2002

Fichier:

PDF, 1.11 MB

2002

5

Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip

Salm, Cora, Blanco Carballo, Victor M., Melai, Joost, Schmitz, Jurriaan

Journal:

Microelectronics Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 486 KB

english, 2008

6

Fabrication and Characterization of the Charge-Plasma Diode

Rajasekharan, Bijoy, Hueting, Raymond J E, Salm, Cora, van Hemert, Tom, Wolters, Rob A M, Schmitz, Jurriaan

Journal:

IEEE Electron Device Letters

Année:

2010

Langue:

english

Fichier:

PDF, 226 KB

english, 2010

7

Process induced poling and plasma induced damage of thin film PZT

Wang, Jiahui, Houwman, Evert, Salm, Cora, Nguyen, Minh, Vergeer, Kurt, Schmitz, Jurriaan

Journal:

Microelectronic Engineering

Année:

2017

Langue:

english

Fichier:

PDF, 633 KB

english, 2017

8

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs

de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan

Journal:

Microelectronics Reliability

Année:

2017

Langue:

english

Fichier:

PDF, 1.33 MB

english, 2017

9

Towards understanding recovery of hot-carrier induced degradation

de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan

Journal:

Microelectronics Reliability

Année:

2018

Langue:

english

Fichier:

PDF, 718 KB

english, 2018

10

[IEEE 2019 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2019.10.13-2019.10.17)] 2019 IEEE International Integrated Reliability Workshop (IIRW) - RFID Tag Failure after Thermal Overstress

Ozturk, Emre, Dikkers, Mike J., Batenburg, Kevin M., Salm, Cora, Schmitz, Jurriaan

Année:

2019

Fichier:

PDF, 1.31 MB

2019

11

An integrated Micromegas UV-photon detector

Joost Melai, Alexey Lyashenko, Amos Breskin, Harry van der Graaf, Jan Timmermans, Jan Visschers, Cora Salm, Jurriaan Schmitz

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Année:

2011

Langue:

english

Fichier:

PDF, 387 KB

english, 2011

12

A UV sensitive integrated Micromegas with Timepix readout

Joost Melai, Amos Breskin, Marco Cortesi, Yevgen Bilevych, Martin Fransen, Harry van der Graaf, Jan Visschers, Victor Blanco Carballo, Cora Salm, Jurriaan Schmitz

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Année:

2011

Langue:

english

Fichier:

PDF, 1.46 MB

english, 2011

13

Qualitative and quantitative characterization of outgassing from SU-8

Joost Melai, Cora Salm, Rob Wolters, Jurriaan Schmitz

Journal:

Microelectronic Engineering

Année:

2009

Langue:

english

Fichier:

PDF, 216 KB

english, 2009

14

Effect of current crowding on electromigration lifetime investigated by simulation and experiment

Nguyen Van Hieu, Cora Salm

Journal:

Computational Materials Science

Année:

2010

Langue:

english

Fichier:

PDF, 496 KB

english, 2010

15

Structural and optical characterization of porous anodic aluminum oxide

GaÌlcaÌ, Aurelian C., Kooij, E. Stefan, Wormeester, Herbert, Salm, Cora, Leca, Victor, Rector, Jan H., Poelsema, Bene

Journal:

Journal of Applied Physics

Année:

2003

Langue:

english

Fichier:

PDF, 613 KB

english, 2003

16

The electrical conduction and dielectric strength of SU-8

Melai, Joost, Salm, Cora, Smits, Sander, Visschers, Jan, Schmitz, Jurriaan

Journal:

Journal of Micromechanics and Microengineering

Année:

2009

Langue:

english

Fichier:

PDF, 443 KB

english, 2009

17

Preparation of metal–SAM–dendrimer–SAM–metal junctions by supramolecular metal transfer printing

Nijhuis, Christian A., ter Maat, Jurjen, Bisri, Satria Z., Weusthof, Marcel H. H., Salm, Cora, Schmitz, Jurriaan, Ravoo, Bart Jan, Huskens, Jurriaan, Reinhoudt, David N.

Journal:

New Journal of Chemistry

Année:

2008

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2008

18

A Radiation Imaging Detector Made by Postprocessing a Standard CMOS Chip

Blanco Carballo, Victor Manuel, Chefdeville, Maximilien, Fransen, Martin, van der Graaf, Harry, Melai, Joost, Salm, Cora, Schmitz, Jurriaan, Timmermans, Jan

Journal:

IEEE Electron Device Letters

Année:

2008

Langue:

english

Fichier:

PDF, 402 KB

english, 2008

19

The Charge Plasma P-N Diode

Hueting, Raymond J. E., Rajasekharan, Bijoy, Salm, Cora, Schmitz, Jurriaan

Journal:

IEEE Electron Device Letters

Année:

2008

Langue:

english

Fichier:

PDF, 309 KB

english, 2008

20

[IEEE 2012 IEEE International Frequency Control Symposium (FCS) - Baltimore, MD, USA (2012.05.21-2012.05.24)] 2012 IEEE International Frequency Control Symposium Proceedings - CMOS-MEMS post processing compatible capacitively transduced GeSi resonators

Kazmi, Syed Naveed Riaz, Aarnink, Tom, Salm, Cora, Schmitz, Jurriaan

Année:

2012

Langue:

english

Fichier:

PDF, 1.25 MB

english, 2012

21

Microelectronics Education ||

Mouthaan, Ton J., Salm, Cora

Année:

1998

Langue:

english

Fichier:

PDF, 38.21 MB

english, 1998

22

Microelectronics Education || Optimisation of a Solar Cell

Mouthaan, Ton J., Salm, Cora

Année:

1998

Langue:

english

Fichier:

PDF, 778 KB

english, 1998

23

ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Low Stress In Situ Boron Doped Poly SiGe Layers for MEMS Modular Integration with CMOS

Kazmi, Syed Naveed Riaz, Aarnink, Tom, Kovalgin, Alexey Y., Salm, Cora, Schmitz, Jurriaan

Année:

2011

Langue:

english

Fichier:

PDF, 321 KB

english, 2011

24

XRD Texture and Morphology Analysis of Polycrystalline LPCVD Germanium-Silicon

Salm, Cora, Klappe, Jos G.E., Holleman, Jisk, Bart Rem, Jan, Woerlee, Pierre H.

Journal:

MRS Proceedings

Année:

1994

Langue:

english

Fichier:

PDF, 333 KB

english, 1994

25

[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - Spring-constant measurement methods for RF-MEMS capacitive switches

Wang, Jiahui, Bielen, Jeroen, Salm, Cora, Schmitz, Jurriaan

Année:

2016

Langue:

english

Fichier:

PDF, 8.35 MB

english, 2016

26

On the small-signal capacitance of RF MEMS switches at very low frequencies

Wang, Jiahui, Bielen, Jeroen, Salm, Cora, Krijnen, Gijs, Schmitz, Jurriaan

Journal:

IEEE Journal of the Electron Devices Society

Année:

2016

Langue:

english

Fichier:

PDF, 1.12 MB

english, 2016

27

[IEEE 2016 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2016.10.9-2016.10.13)] 2016 IEEE International Integrated Reliability Workshop (IIRW) - Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

Wang, Jiahui, Salm, Cora, Houwman, Evert, Nguyen, Minh, Schmitz, Jurriaan

Année:

2016

Fichier:

PDF, 819 KB

2016

28

Recovery after hot-carrier injection: Slow versus fast traps

de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan

Journal:

Microelectronics Reliability

Année:

2019

Langue:

english

Fichier:

PDF, 836 KB

english, 2019

29

Recovery after hot-carrier injection: Slow versus fast traps

de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan

Journal:

Microelectronics Reliability

Année:

2019

Fichier:

PDF, 836 KB

2019

30

[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices

de Jong, Maurits J., Salm, Cora, Schmitz, Jurriaan

Année:

2020

Fichier:

PDF, 1.87 MB

2020